High-strength polyethylene films containing 0.5- 1.0 wt. % of nanocrystalline silicon (nc-Si) were synthesized. Samples of nc-Si with an average core diameter of 7-10 nm were produced by plasmochemical method and by laser-induced decomposition of monosilane. Spectral studies revealed almost complete (up to ~95%) absorption of UV radiation in 200-400 nm spectral region by 85 micron thick film if the nc-Si content approaches to 1.0 wt. %. The density function of particle size in the starting powders and polymer films containing immobilized silicon nanocrystallites were obtained using the modeling a complete profile of X-ray diffraction patterns, assuming spherical grains and the lognormal distribution. The results of X-ray analysis shown that the crystallite size distribution function remains almost unchanged and the crystallinity of the original polymer increases to about 10% with the implantation of the initial nc-Si samples in the polymer matrix.
полиэтилен, нанокристаллический кремний, пленка с защитой от УФ-излучения, полимерные нанокомпозиты, спектроскопия, рентгеновский дифракционный анализ, polyethylene, nanocrystalline silicon, UV-protective film, polymer nanocomposites, spectroscopy, X-ray diffraction analysis
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